Appeal No. 2001-1642
Application No. 09/191,310
The Invention
The invention relates to a method and apparatus for
determining defective pixels within an image sensor by using a
sequential analysis of each pixel and comparing it to nearby
pixels. (Specification, page 1, lines 4-6). For unclassified
pixels, each is given a score based upon an observation, and if
the score satisfies a stopping condition that pixel is then
classified. The process is repeated for any remaining
unclassified pixels (Specification, page 5, lines 2-9).
The Rejection of Claims 1-20 Under 35 U.S.C. § 102(b)
The examiner has found that Ebel discloses a method of
detecting defective sensors in an array by performing an
observation of an object on a sensor array having a plurality of
pixels, each pixel corresponding to a sensor of said sensor array
and each sensor generating a pixel value for the corresponding
pixel. For each unclassified pixel, Ebel determines a score based
upon statistical analysis of the pixel using the observation, and
if the score for the pixel satisfies a stopping condition,
classifying each pixel as being one of either defective or
functional. (Final Rejection, paper #5, page 3, line 15 - page 4,
line 2).
The appellants’ principal argument is that the “defective
pixels” referred to in Ebel do not relate to the sensor array, but
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