Appeal No. 2001-1642
Application No. 09/191,310
defective sensors in a sensor array. Column 6, lines 5-7 of Ebel
evidences that as a part of its overall method, it detects
defective sensors in a sensor array and compensates for them.
In the claimed method the following steps occur, with the
corresponding function also noted from the prior art Ebel:
1) performing an observation of an object on a sensor array
having a plurality of pixels, each pixel corresponding to a sensor
of said sensor array and each sensor generating a pixel value for
the corresponding pixel. We note that the observation of the
uniform target image of Ebel (column 6, lines 5-7) occurs on the
sensor array, which generates pixel values for corresponding
pixels. The image is then manually viewed, which indicates that
values must be generated in order to generate an image for display
purposes.
2) for each of said pixels, determining a score based on
statistical analysis of said pixel values using said observation.
We observe that in Ebel the manual observation of a region where
gray level values deviate unexpectedly reasonably appears to us to
reasonably be a form of statistical analysis, as defined by the
instant specification. At page 7, lines 18-24, the statistical
analysis is described as:
In the SPRT [Sequential Probability Ratio Test – a
statistical analysis] approach an inference is made which
attempts to identify one of two hypotheses from a sequence of
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