Ex Parte CHEN et al - Page 2




               Appeal No. 2001-2146                                                                                                 
               Application No. 09/270,588                                                                                           

                                                                                                                                   

                                                   THE INVENTION                                                                    

               The invention is directed to a method for stripping a patterned photoresist layer.  The                              
               multi-step process is one comprising providing a substrate, forming a target layer over the                          
               substrate and forming a patterned positive photoresist layer on the target layer.  The                               
               patterned photoresist layer acts as a mask for processing of the target layer.  Following                            
               processing, one obtains a processed target layer and a processed patterned positive photoresist                      
               layer.  The processed patterned positive photoresist is thereafter photo-exposed and stripped                        
               while employing a solvent.  Additional limitations are described in the following illustrative                       
               claim.                                                                                                               

                                                           THE CLAIM                                                                

               Claim 1 is illustrative of appellants’ invention and is reproduced below.                                            
               1.      A method for stripping a patterned photoresist layer comprising:                                             
                       providing a substrate;                                                                                       
                       forming over the substrate a target layer;                                                                   
                       forming upon the target layer a patterned positive photoresist layer;                                        
                                                                                                                                   
                       processing the target layer while employing the patterned positive photoresist layer as a                    
               mask layer to thus form from the target layer a processed target layer and to form from the                          
               patterned positive photoresist layer a processed patterned positive photoresist layer;                               


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