Ex Parte CHEN et al - Page 12




               Appeal No. 2001-2146                                                                                                 
               Application No. 09/270,588                                                                                           

               photoexposing the processed patterned positive photoresist layer to form a                                           
               photoexposed processed patterned positive layer with enhanced solubility of the                                      
               photoexposed processed patterned positive photoresist layer within a solver; and                                     
                                                                                                                                   
               stripping from the processed target layer the photexposed processed patterned positive                               
               photoresist layer while deploying the solvent.                                                                       










               Since neither Miyashita nor Sato is relied on to show the above missing feature, I concur with                       
               the majority’s view regarding reversal of the examiner’s §103 rejections.  However, I do not                         
               approve of and dissociate myself from the majority’s remand order for the reasons indicated                          

               supra, for it wastes the PTO’s critical resources in unproductive exercises.                                         
                                                                                                                                   



                                      CHUNG K. PAK                )    BOARD OF PATENT                                              
                                      Administrative Patent Judge )          APPEALS AND                                            
               )        INTERFERENCES                                                                                               





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