Appeal No. 2002-0934 Application No. 09/392,276 The Examiner’s assertion that the device of figure 1 is suitable for routing power supply voltages through the substrate appears to have been derived from Appellants’ specification. The Examiner has not identified a basis in the prior art and the admitted art to modify the semiconductor device of figure 1 to use 0.2 micron technology in the manner proposed by the Examiner. The Examiner’s statement “that nowadays it is well known in the art to use 0.2 micron technology for semiconductor devices, of which official notice is taken” does not provide motivation for modifying the device of figure 1 to meet the requirements of claims 1 and 9. The Examiner has not refered to any evidence that teaches or suggests the connection of a power supply to the back side of a semiconductor device that uses 0.2 micron technology.1 The mere fact that the prior art could be modified would not have made the modification obvious unless the prior art suggested the desirability of the modification. In re Gordon, 733 F.2d 900, 902, 221 USPQ 1125, 1127 (Fed. Cir. 1984); In re Laskowski, 871 F.2d 115, 117, 10 USPQ2d 1397, 1398 (Fed. Cir. 1989). The record indicates that the motivation relied upon by the Examiner suggesting the combination of APA, Tran and Hshieh came from the Appellants’ description of their invention in the specification rather than from the 1 Contrary to the Examiner’s assertion in the Answer, we find no unequivocal admission on the part of the Appellants at pages 7 and 8 of the specification. -6-Page: Previous 1 2 3 4 5 6 7 8 9 NextLast modified: November 3, 2007