Ex Parte GARDNER et al - Page 5



          Appeal No. 2003-2079                                                        
          Application No. 09/207,972                                                  

          in the Kizilyalli ‘435 application (Brief, page 4).2  The examiner          
          has failed to establish where these two claimed limitations are             
          supported, under sections 120/112, by the parent Kizilyalli                 
          application ‘435.  Accordingly, the examiner has not established            
          that Kizilyalli ‘238 should be accorded the effective filing date           
          of Dec. 22, 1997.  Therefore Kizilyalli ‘238 only has an effective          
          filing date of June 25, 1999, and is not available as prior art to          
          reject the claims on appeal.  Thus we cannot sustain the examiner’s         
          rejections based on Kizilyalli ‘238.                                        
               The decision of the examiner is reversed.                              
          REMAND                                                                      
               As discussed above, the Kizilyalli ‘435 application was issued         
          as the ‘854 patent on Apr. 15, 2003 (Answer, page 5; Reply Brief,           
          page 3).  As stated by the examiner (Answer, page 6), the claimed           
          subject matter on appeal is obvious over “the Kizilyalli parent             
          patent” in combination with Wu and Chou.  Appellants and the                
          examiner have previously agreed that the effective filing date of           
          the Kizilyalli ‘435 application (now the ‘854 patent) establishes           

               2These two limitations are found in claim 1 (“said                     
          dielectric material layer having an equivalent electrical                   
          thickness of 2.2 nm or less”) and claim 11 (“an electrode                   
          disposed directly on said at least one layer of high-k dielectric           
          material”).                                                                 
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