Ex Parte Wu - Page 1



               The opinion in support of the decision being entered today was not     
               written for publication and is not binding precedent of the Board.     

                                                       Paper No. 17                   

                      UNITED STATES PATENT AND TRADEMARK OFFICE                       
                                     __________                                       
                         BEFORE THE BOARD OF PATENT APPEALS                           
                                  AND INTERFERENCES                                   
                                     __________                                       
                             Ex parte DAVID DONGGANG WU                               
                                     __________                                       
                                Appeal No. 2003-1315                                  
                             Application No. 09/503,838                               
                                     __________                                       
                                      ON BRIEF                                        
                                     __________                                       
          Before HAIRSTON, BARRETT, and BARRY, Administrative Patent Judges.          
          HAIRSTON, Administrative Patent Judge.                                      

                                 DECISION ON APPEAL                                   
               This is an appeal from the final rejection of claims                   
          1 through 14, 16 and 17.                                                    
               The disclosed invention relates to a method for testing a              
          semiconductor chip by determining the parasitic capacitance of a            
          dummy structure in the semiconductor chip, storing the parasitic            
          capacitance value in memory, and then analyzing a test structure            






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