Ex Parte PHAM et al - Page 9




          Appeal No. 2003-1365                                                        
          Application No. 09/376,659                                                  

          the motivation, suggestion or teaching may come explicitly from             
          statements in the prior art, the knowledge of one of ordinary               
          skill in the art, or, in some cases the nature of the problem to            
          be solved.  See In re Dembiczak, 175 F.3d 994, 999, 50 USPQ2d               
          1614, 1617 (Fed. Cir. 1999).                                                
               After reviewing Gardner ‘298 we agree with the Examiner that           
          the step of “forming first and second protective shoulders” is              
          disclosed in the references as forming a first nitride protective           
          shoulder 36 and a second protective shoulder 40 (answer, page 3).           
          As depicted in Figure 7, the nitride spacer 36 and the oxide                
          spacer 40 are formed on side 20 of a gate stack which block the             
          dopants during ion implantation, and certainly, prevent charge              
          migration during the subsequent process steps.  We also observe             
          that the thin oxide layer 30 (col. 5, lines 15-21) covering the             
          gate stack and the entire substrate, which is apparently                    
          characterized by Appellants (brief, page 6) as an additional                
          spacer, is the same oxide layer that is disclosed by Appellant              
          (specification, page 4, lines 17-20) to cover the gate stacks.              
          Therefore, this thin oxide layer is neither a part of the two-              
          layer protective shoulders nor can be considered as an additional           
          spacer.                                                                     



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