Appeal No. 2004-0581 Application No. 09/041,105 The examiner does not suggest to structurally modify Yoshioka[’s] device such that during certain modes of operation the second conduction type well relatively low in impurity density is fully depleted. Yoshioka[’s] structure is identical to the claimed structure. Thus, Yoshioka[’s] structure can also operate at high voltage, such that a RESURF occurs and the second conduction type well relatively low in impurity density is fully depleted [as required by appealed claim 1]. Significantly, the appellants do not dispute the examiner’s position that the semiconductor device of Yoshioka includes structural elements which correspond to each of the structural elements recited in claim 1. Instead, the only distinction urged by the appellants relates to the functional requirement of this claim. Under these circumstances, wherein the only alleged distinction between appealed claim 1 and Yoshioka involves the appellants’ claimed functional requirement, it was entirely appropriate for the examiner to take the position that Yoshioka’s device necessarily and inherently would possess the same functional characteristics as the here claimed device. See In re Ludtke, 441 F.2d 660, 664, 169 USPQ 563, 566-67 (CCPA 1971). The mere fact that Yoshioka contains no disclosure regarding this function does not defeat the examiner’s unpatentability determination. See In re Schreiber, 128 F.3d 1473, 1477, 44 USPQ2d 1429, 1431 (Fed. Cir. 1997). The identity of structural elements between Yoshioka’s device and the appellants’ 6Page: Previous 1 2 3 4 5 6 7 8 9 10 11 12 NextLast modified: November 3, 2007