Appeal No. 2005-1256
Application No. 09/988,593
OPINION
A claim is anticipated only when a single prior art reference expressly or
inherently discloses each and every element or step thereof. Constant v. Advanced
Micro-Devices Inc., 848 F.2d 1560, 1570, 7 USPQ2d 1057, 1064 (Fed. Cir. 1988); RCA
Corp. v. Applied Digital Data Systems, Inc., 730 F.2d 1440, 1444, 221 USPQ 385, 388
(Fed. Cir. 1984). If the examiner presents a reasonable basis for alleging inherency, the
burden shifts to appellants to come forward, if they can, with evidence to the contrary.
In re King, 801 F.2d 1324, 1326, 231 USPQ 136, 138 (Fed. Cir. 1986); In re Ludtke, 441
F.2d 660, 664, 169 USPQ 563, 566-67 (CCPA 1971); In re Swinehart, 439 F.2d 210,
213, 169 USPQ 226, 229 (CCPA 1971).
The examiner asserts that Flaker discloses a semiconductor device having an
SOI structure formed by a semiconductor substrate, an embedded insulating layer 48
and a first conductivity type (p-) SOI layer 46. The examiner identifies a plurality of
element forming regions 54, each formed with prescribed elements (Figures 8, 10, and
12); an isolation film 40 (Figure 10B) provided in an upper layer part of the SOI layer for
isolating the plurality of element forming regions from each other; a first conductivity
type semiconductor region (body link, Figure 10B) provided under the isolation film 40
as part of the SOI layer, with the first conductivity type body link semiconductor region
4
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