Appeal 2007-0409
Application 10/479,203
RELEVANT FINDINGS OF FACT (“FF”)
Uchiumi
(1) Uchiumi is directed to manufacturing methods for optical recording
media. Uchiumi teaches that a recording can be generally performed
by varying the conditions of recording films while light is selectively
radiated between amorphous crystal and crystal or between crystals.
(Uchiumi 2).
(2) Uchiumi Figure 1 shows a layered stack comprising a substrate 1,
transparent film 2, recording film 3, protective film 4 and metal
electrode film 5.
(3) In Example 1, the layered stack comprises a disk glass substrate 1, an
electrode film 2 of SnO2 and ITO having a preferred thickness of 50 to
500 nm, a recording film 3 of an alloy of Te and Sn having a thickness
of 150 nm, a protective film 4 of SnO2 or ITO having a thickness of
150 nm, and a chromium electrode film 5 having a thickness of 200
nm.
(4) According to Uchiumi, the electrode film 2 of SnO2 and ITO acts as a
protective film. (Uchiumi 4).
(5) In Examples 1-3 of Uchiumi, the recording film 3 of Te and Sn is
deposited in an amorphous state (see Uchiumi 5, ¶ 1) and then
crystallized by heat treatment (see Uchiumi 5, ¶ 4).
(6) Uchiumi teaches that each of the optical recording media of Examples
1-3 is rewritable. (Uchiumi 8:7-8).
Nonaka
5
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