Ex parte IWAMURO - Page 3

          Appeal No. 95-4159                                                          
          Application 08/151,055                                                      

                    a third diffused region of second conductivity                    
          type formed in an opposite second surface of the substrate and              
          having a depth of at least 2 microns; and                                   
                    a drain electrode in contact with said third                      
          The examiner relies on the following references:                            
          Fay et al. (Fay)              5,237,183          Aug. 17, 1993              
          (filed Dec. 14,                                                             
          T. Laska et al. (Laska), “A 2000 V-Non-Punch-Through-IGBT with              
          Dynamical Properties like a 1000 V-IGBT,” International                     
          Electron Devices Meeting, December 9-12, 1990, pages 32.6.1-                
          Claims 1-3, 6 and 7 stand rejected under 35 U.S.C.                         
          103.  As evidence of obviousness the examiner offers Fay in                 
          view of Laska.                                                              
          Rather than repeat the arguments of appellant or the                        
          examiner, we make reference to the brief and the answer for                 
          the respective details thereof.                                             
          We have carefully considered the subject matter on                          
          appeal, the rejection advanced by the examiner and the                      
          evidence of obviousness relied upon by the examiner as support              
          for the rejection.  We have, likewise, reviewed and taken into              
          consideration, in reaching our decision, the appellant’s                    

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