Ex parte LEE et al. - Page 4




          Appeal No. 94-0809                                                           
          Application 07/707,365                                                       
          162 USPQ 145, 147 (CCPA 1969), so the patentability of a novel               
          method of manufacturing a product may not be limited by the                  
          patentability of the product made.                                           
               For example, appellants argue that Nishizaka forms trenches             
          and fills them with polycrystalline silicon which “may be doped              
          with impurities to be the same conduction type as that of the                
          substrate” (col. 4, l. 16-18) and emphasize that Nishizaka’s                 
          trenches are not identical in “structure” to the polysilicon2                
          plugs depicted in their drawings (Reply Brief (RB.), p. 1,                   
          third para.; emphasis added):                                                
               There is a fundamental reason why Nishizaka does not                    
               teach or suggest these steps, and this reason is founded                
               in the details of the structure taught by Nishizaka.  The               
               polysilicon plugs 10 (i.e., the buried polycrystalline                  
               silicon layer) of Nishizaka are not part of or over the                 
               source/drain regions of Nishizaka.  Nor are they part of                
               the device; rather, the trenches are used to separate                   
               elements.                                                               
          Appellants argue that because of this different “structure”                  
          (id.), “Nishizaka refers to the function of these trenches as                
          ‘element separating trenches.’  Thus, the trenches serve no                  
          purpose other than to isolate elements; that is, they do not                 
          function as source/drain regions” (Brief on Appeal, p. 3, first              


              2    Polysilicon is another name for polycrystalline silicon.           
          See Godejahn, col. 2, l. 7-9 (“A doped polycrystalline silicon               
          layer is applied to such a wafer and a silicon nitride layer is              
          then applied atop the polysilicon layer.”)                                   
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