Appeal No. 96-1271
Application No. 08/190,388
Claims 1, 3 through 7 and 9 through 11 stand rejected
under 35 U.S.C. § 103. As evidence of obviousness, the
examiner cites Lechaton and Welch with regard to claims 1, 3,
4, 6 and 7, adding prior art Figures 28-31 with regard to
claims 9 through 11 and adding prior art Figure 34 to the
Lechaton/Welch combination with regard to claim 5.
Reference is made to the briefs and answer for the
respective positions of appellant and the examiner.
OPINION
We reverse.
With regard to the independent claims, the examiner
applies Lechaton, specifically referring to Figure 4 therein.
The semiconductor device of Figure 4 of Lechaton is identified
by the examiner as having a collector impurity region 12, a
base impurity region 22, an emitter impurity region 30 and a
base contact impurity region (annular region) 34, all as
claimed. With this much, appellant agrees.
Appellant also agrees with the examiner that while
Lechaton discloses a platinum or palladium silicide layer 36,
4
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