WANG V. TUCHOLSKI - Page 117




          Interference No. 103,036                                                    


          mean either electrically or thermally nonconductive.  BR 3938 to            
          3939.                                                                       
                   Mr. Patrick D. Hein testified on the problem of heat              
          sinking when a battery strength or voltage indicator is attached            
          to a battery.  CR 1075 to 1081.  Mr. Hein testified that he                 
          tested various materials and found that group III materials (ten            
          thin synthetic polymeric films having thicknesses ranging from              
          0.001 to 0.005 inches) had severe heat sinking problems.  CR                
          1077, 1078, 1080 and 1081.                                                  
                    With respect to the heat sinking problem in the context           
          of this interference, Mr. Hein testified at CR 1143 that heat               
          sinking creates difficulties, i.e., it decreases the observed               
          temperature profile on the battery tester/voltmeter when it is in           
          proximity to a battery container, thus displaying inaccurate or             
          incorrect readings when the tester mechanism is activated.                  
          Mr. Hein explained at CR 1194:                                              
                    In the case of a fresh cell with the                              
                    temperature profiles that we exhibited, for                       
                    an example, it [the fresh cell] might show                        
                    that it had only three-quarters of available                      
                    power, when, in effect, it was the fresh cell                     
                    that had 100 percent available power.                             
          However, Mr. Hein acknowledged at CR 1195 that one could get an             
          accurate good/bad type reading if the tester mechanism was                  
          properly designed.  He also testified at CR 1195 and 1196:                  


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