Appeal No. 1997-1060
Application No. 08/172,848
Accordingly, the change in state of output RDE on device
(54) located within the semiconductor memory device meets the
limitation of “. . . changing the state of at least one device
output . . .” as required by claim 11.
Thus, we will sustain the examiner’s rejection of claim
11 since all of the limitations required by claim 11 are found
in Saito.
Turning now to claim 37, the limitation of “configuring
the device in at least one test a [sic] mode” is again met by
applying the supply voltage (V ) and supplying test signals
cc
TEST 1 to TEST M to appropriate pads on the exchange
controller. The limitation of “sensing a programmed signal
indicating whether redundancy has been implemented on the
device” is met by any of address detectors 50-1 to 50-M. The
limitation of “changing the state of at least one device
output when the first signal has a predetermined value,
wherein whether redundancy implementation of redundant
elements in the semiconductor memory device is indicated by
the changed state of the at least one device output” is met by
device (54) and the change in state of its output RDE when
10
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