Appeal No. 98-1643
Application No. 08/544,582
and second paragraphs. Since, as to the remaining rejection,
claims 3 through 17 are now indicated as being directed to
allowable subject matter, the appeal before us involves only
claims 1 and 2.
The invention is directed to a tester for integrated
circuits wherein testing functions are performed by both a
semiconductor chip and a testing set for inputting signals to
an integrated circuit under test. The semiconductor chip is
in direct contact with the integrated circuit under test.
Representative independent claim 1 is reproduced as
follows:
1. A tester for integrated circuits, comprising:
(a) a testing set for supplying inputs to an
integrated circuit under test for operation thereof and for
measuring outputs of said integrated circuit under test; and
(b) a semiconductor chip or wafer arranged to be in
direct contact with said integrated circuit under test, said
semiconductor chip or wafer having at least one testing
function for testing said integrated circuit under test.
The examiner relies on the following reference:
Leedy 5,020,219 Jun. 4,
1991
Claims 1 and 2 stand rejected under 35 U.S.C. § 102(b) as
anticipated by Leedy.
2
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