Ex parte NAKAIZUMI - Page 3




          Appeal No. 98-1643                                                          
          Application No. 08/544,582                                                  

               Reference is made to the brief and final rejection and                 
          answer for the respective positions of appellant and the                    
          examiner.                                                                   




                                       OPINION                                        
               We affirm.                                                             
               The examiner appears to rely on two different embodiments              
          of Leedy as support for the rejection.  The examiner relies on              
          the embodiment of Fig. 4a of the reference for the teaching of              
          a testing set and, apparently, on the embodiment of Fig. 14 of              
          the reference for the teaching of a semiconductor chip or                   
          wafer (134) in direct contact with the integrated circuit                   
          under test (133) and having at least one testing function.                  
               We do not agree with appellant’s argument that it is                   
          improper for the examiner to rely on elements of two separate               
          embodiments of a reference.   A rejection  under 35 U.S.C.                  
          § 102(b) requires a disclosure of the claimed subject matter                
          in a single reference.  Leedy is a single reference and we                  
          find no impropriety in relying on different teachings within                



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