Appeal No. 98-1643
Application No. 08/544,582
under test directly from that outside source. Since there
must be some source providing the input signals and measuring
the output signals, then that would be suggestive of using the
outside source, i.e., the tester signal processor, shown in
the Fig. 4a embodiment.
Thus, if there is an outside source inputting the signals
to, and receiving the output signal from, the circuit under
test, then there is the suggestion of the two separate
elements, i.e., a “testing set” and “a semiconductor chip or
wafer,” required by instant claims 1 and 2.
Even if there is no outside source shown in Fig. 14 of
Leedy and the signals are input from, and outputted to, the
tester/logic circuit 134, itself, the claim language is still
met because the “testing set” of the claims, as broadly
recited, is not required to have any testing function. The
claims only require that the “testing set” supply inputs to
the circuit under test and measure outputs from the circuit
under test. Clearly, something provides the input signals to,
and measures outputs from, the circuit under test. Either
such is supplied by an outside source, as suggested in Fig. 4a
of Leedy, in which case this is exactly what is claimed and
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Last modified: November 3, 2007