Ex parte HUANG et al. - Page 5




          Appeal No. 1997-3338                                                          
          Application No. 08/402,252                                                    


               In each of the rejections stated in the answer, the                      
          examiner has identified Koyanagi or Scovell as the closest                    
          prior art reference.  The appellants, however, have pointed                   
          out that Koyanagi and Scovell do not teach or suggest                         
          chemical-mechanical polishing or plasma etchback of the metal                 
          layer outside the contact openings to form a metal plug, as                   
          recited in the appealed claims (appeal brief, page 4).                        
               To remedy the deficiencies of Koyanagi and Scovell, the                  
          examiner has relied upon Tsang, Shappir, Lee, Sun, and Sandhu.                
          Specifically, the examiner has repeatedly stated:                             
                    It would have been obvious to on[e] of ordinary                     
               skill in the art at the time the invention was made                      
               to modify the above references’ teachings as taught                      
               by Sun et al., Lee et al., and Sandhu et al. because                     
               such use of planarized plugs by CMP [chemical-                           
               mechanical polishing] or etchback and the claimed                        
               deposition processes and materials are conventional                      
               and obvious as evidenced by Sun et al., Lee et al.,                      
               and Sandhu et al. to enable the formation of a                           
               planarized plug for                                                      










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