Appeal No. 1997-3358 Page 2 Application No. 08/477,742 BACKGROUND The invention at issue in this appeal enables built-in, self-testing of a smart memory. A smart memory is a memory that includes on-chip processing capabilities that allow for implementation of a parallel processing system. The performance of such a system depends on the reliability of its components, particularly on the reliability of its smart memories. The invention enables a smart memory to perform a self- test to detect its operability. Because the self-test is done internally, it can be completed quickly so as not to degrade the efficiency of a parallel processing system in which the smart memory resides. Claim 32, which is representative for our purposes, follows: 32. A method of self-testing a smart memory including a data RAM, a broadcast RAM, and a data path which includes a plurality of processing elements operable to perform specific functions, comprising the steps of:Page: Previous 1 2 3 4 5 6 7 8 9 10 11 12 13 14 NextLast modified: November 3, 2007