Ex parte YU - Page 14




          Appeal No. 1997-3635                                                        
          Application No. 08/498,357                                                  

          Piasecki, 745 F.2d 1468, 1471-72, 223 USPQ 785, 787-88 (Fed.                
          Cir. 1984); In re Knapp-Monarch Co., 296 F.2d 230, 232, 132                 
          USPQ 6,                                                                     
          8 (CCPA 1961); In re Cofer, 354 F.2d 664, 668, 148 USPQ 268,                
          271-72 (CCPA 1966).  Furthermore, our reviewing court states                
          in Piasecki, 745 F.2d at 1472, 223 USPQ at 788 (Fed. Cir.                   
          1984) the following:                                                        
               The Supreme Court in Graham v. John Deere Co.,                         
               383 U.S. 1, 148 USPQ 459 (1966), focused on the                        
               procedural and evidentiary processes in reaching                       
               a conclusion under section 103.  As adapted to                         
               ex parte procedure, Graham is interpreted as                           
               continuing to place the "burden of proof on the                        
               Patent Office which requires it to produce the                         
               factual basis for its rejection of an application                      
               under section 102 and 103" [citing In re Warner,                       
               379 F.2d 1011, 1016, 154 USPQ 173, 177 (CCPA 1967)]                    
               [emphasis added].                                                      
               After a review of Wong’s disclosure, we fail to find any               
          teachings related to the thickness of the metal and the                     
          silicon layers.  We do not agree with the Examiner that the                 
          claimed thicknesses are conventional and obtained by merely                 
          changing the dimensions disclosed in the prior art.  In this                
          case, the prior art teaches the relative thicknesses but is                 
          silent with regard to the actual thickness of barrier                       
          metallization and the amorphous silicon.  Therefore, Wong                   

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