Appeal No. 1997-4069 Page 11
Application No. 08/282,913
Claims 18-21
The appellant makes the following argument.
[N]o reasonable combination of the Choi and Hurley
patents disclose or reasonably suggest a module
including a printed circuit board having a prober
testing opening with an integrated circuit mounted
over the prober testing opening such that a sensor
probe can access the die through the prober testing
opening when the die is exposed and while the die is
still electrically connected to the module. (Appeal
Br. at 13.)
The examiner’s reply follows.
Hurley teaches (col. 5, lines 44-58) a modification
such that the actual stage is a hole cut into the
vibration isolation table which allows the DUT in
its socket to extend into the light tight enclosure.
Examiner contends that for [sic] a person having
ordinary skill in the art would [have] be[en]
motivated [sic] to modify Choi test system to be
able to incorporate the emission microscope and the
modification stated above. This is because both
systems are from the same environment and Hurley's
emission microscope provides capabilities for
detecting in-process and use-related defects in
integrated circuits and provides available interface
to ATE tester of the type disclosed by Choi which is
motivation ... for the modification stated above.
(Examiner’s Answer at 12.)
Claims 18-21 each specify in pertinent part the following
limitations:
a printed circuit board ... having a prober
testing opening formed therein; and
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