Ex parte ADACHI et al. - Page 8




          Appeal No. 1998-2405                                                        
          Application 08/351,093                                                      


               Tanemura discloses a method for preparing a sample to be               
          examined using a transmission electron microscope, the method               
          comprising scanning the sample with radiation in the presence               
          of carbon-containing molecules floating in the atmosphere to                
          dissociate the molecules and thereby form a film in the                     
          irradiated region, and then irradiating the sample with an ion              
          ray to remove portions of the sample not covered by the film                
          (pages 5 and 7).  Regarding the type of radiation used in                   
          forming the film, Tanemura states: “The irradiation is carried              
          out by means of radiations, i.e., electron ray, laser light,                
          X-ray, neutron ray or (-ray, etc. having energy necessary for               
          deposition of the molecules.  Easily controllable electron                  
          ray, laser light and X-ray are desired among them” (page 6).                
          The reference does not disclose forming the film using ion                  
          beam radiation.                                                             
               The examiner argues that, in view of the combined                      
          teachings of Franke, Nakagawa and Ozaki, it would have been                 
          obvious to one of ordinary skill in the art to form Tanemura’s              
          film using ion beam radiation “based upon the commonality of                
          the reactive etch conditions in the references and the                      
          equivalence of the deposited materials with conventional                    
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