Ex Parte CHEN et al - Page 1



               The opinion in support of the decision being entered today was not         
               written for publication and is not binding precedent of the Board.         
                                                                  Paper No. 14            
                       UNITED STATES PATENT AND TRADEMARK OFFICE                          
                                      ____________                                        
                           BEFORE THE BOARD OF PATENT APPEALS                             
                                    AND INTERFERENCES                                     
                                      ____________                                        
                  Ex parte JASON CHEN, BAO-SHIANG SUN, and HENRY FAN                      
                                      ____________                                        
                                  Appeal No. 2000-1251                                    
                               Application No. 08/843,786                                 
                                      ____________                                        
                                        ON BRIEF                                          
                                      ____________                                        
          Before FLEMING, LALL, and LEVY, Administrative Patent Judges.                   
          FLEMING, Administrative Patent Judge.                                           
                                   DECISION ON APPEAL                                     
               This is a decision on appeal from the final rejection of                   
          claims 12-13 and 20-22.  Claims 1-6, 8-11 and 14-15 are not part                
          of the appeal.1                                                                 
               The invention relates to an integrated circuit (IC) and a                  
          method for protecting an IC against the consequences of having                  
          erroneously entered a test mode during normal operation.  The IC                
          (1) includes a start test mode circuit for generating a test mode               

               1 Claims 1-6 and 8-11 have been indicated as allowable in                  
          Paper No. 8.  Claims 14-15 have been objected to in Paper No. 8                 
          as being dependent upon a rejected claim, but would be allowable                
          if rewritten in independent form incorporating the limitations of               
          claims 12-13.                                                                   




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