Ex Parte YAMADA - Page 4




          Appeal No. 2000-1608                                                         
          Application 08/953,998                                                       

                    a second step of dividing a range of said vertical                 
               angle 2 into sections of an equal interval, counting a                  
               number of the ejected particles for every section of said               
               vertical angle 2, and calculating a vertical distribution               
               function by interpolating the counted numbers of the ejected            
               particles as a function of said vertical angle 2,                       
                    a third step of determining values of said vertical                
               angle 2 likely to emerge in a random process of a particle              
               ejection from said target using said vertical distribution              
               function as a criterion to judge whether the particle                   
               ejection at said vertical angle 2 is to be accepted as                  
               likely to occur or to be rejected as unlikely to occur,                 
                    a fourth step of determining values of said horizontal             
               angle N likely to emerge in a random process of a particle              
               ejection from said target, and                                          
                    a fifth step of calculating tracks of sputtered                    
               particles in a sputtering arrangement using the values of               
               said vertical angles and said horizontal angles determined              
               by the third step and the fourth step in accordance with the            
               Monte Carlo method.                                                     

               The Examiner relies on the following prior art: 2                       
               Yamada et al. (Yamada), A Sputter Equipment Simulation                  
               System Including Molecular Dynamical Target Atom Scattering             
               Model, IEEE Proc. of Int'l Elec. Devices Mtg., Washington,              
               DC, Dec. 10-13, 1995, pp. 93-96 (numbered as 4.5.1-4.5.4 in             
               the reprint copy).                                                      
               Claims 1-6 stand rejected under 35 U.S.C. § 101 as being                
          directed to nonstatutory subject matter as an algorithm.                     
               Claims 1-6 stand rejected under 35 U.S.C. § 112, second                 
          paragraph, as indefinite for failing to particularly point out               

          2  In the examiner's answer, the Examiner cites supplemental                 
          prior art in response to Appellant's arguments.  This prior art              
          is not part of the art rejection.  We find it unnecessary to rely            
          on this supplemental prior art in any way; thus, it will not be              
          listed or discussed.                                                         
                                        - 4 -                                          





Page:  Previous  1  2  3  4  5  6  7  8  9  10  11  12  13  Next 

Last modified: November 3, 2007