Ex Parte YANG et al - Page 13




          Appeal No. 2002-0974                                                        
          Application 09/332,745                                                      

          silicon wafers prepared by the Cz process, we find that the                 
          references are not necessary to sustain the rejection before us             
          because appellants prepare their silicon wafers using the same              
          process as Asayama et al. use to prepare their wafers.                      
               It is not entirely clear from appellants' arguments                    
          concerning the alleged separate patentability of claim 28 what is           
          the limitation in claim 28 which renders it separately patentable           
          from appellants' other claims. It is not an adequate "argument"             
          to simply point out what the claim covers or how it differs from            
          the prior art. It is necessary to explain why the differences               
          between what is claimed and the prior art would not have been               
          obvious in the sense of § 103. Nevertheless, it appears that it             
          is the limitation concerning the thickness of the epitaxial layer           
          in claim 28 which appellants believe sets claim 28 apart from the           
          prior art. That is, claim 28 requires an epitaxial layer of at              
          least about 0.1 :m and less than 3 :m. But Asayama et al.                   
          discloses depositing epitaxial layers "approximately 3 :m thick"            
          on their silicon wafers. See paragraph 18, last sentence. That              
          disclosure meets the limitation in claim 28 because                         
          "approximately 3 :m" would have been understood to mean slightly            
          more than or slightly less than 3 :m. Also note that Inoue et               
          al. discloses depositing epitaxial layers of GaAs of from 1 to 2            

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