Ex Parte HUH et al - Page 4



          Appeal No. 1999-1674                                                        
          Application No. 08/923,949                                                  

          tank, a wafer carrier, a single first jet nozzle in the bottom              
          [center] of the tank and a plurality of second jet nozzles                  
          . . . . ”  See the final Office action dated June 9, 1998, page             
          2, together with the Answer, page 3.  These jet nozzles, which              
          are particularly placed at the bottom of the tank, are used to              
          generate up and down swirling motion in the cleaning liquid in              
          the tank.  See Seiichiro, column 3, lines 1-15, together with               
          Seiichiro’s Figures 2 and 3.  The purpose of this arrangement is            
          to eliminate zones of poor circulation of the cleaning liquid in            
          the wafer cleaning tank.  See column 1, lines 30-45.                        
               Recognizing the absence of the teaching on the part of                 
          Seiichiro regarding the claimed nozzle arrangement, the examiner            
          relies on the disclosures of Hayami and Ando.  See the final                
          Office action dated June 9, 1998, page 2, together with the                 
          Answer, page 3.  The examiner asserts that both Hayami and Ando             
          teach that the employment of the claimed plurality of first jet             
          nozzles in the bottom center of the tank is known.  See the final           
          Office action dated June 9, 1998, pages 2-3, together with the              
          Answer, page 3.  The examiner also asserts that Hayami teaches              
          that the employment of the claimed plurality of second jet                  
          nozzles on the sides of the tank with their openings facing the             

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