Ex Parte BLALOCK et al - Page 11




          Appeal No. 1999-2347                                                        
          Application 08/892,560                                                      

          hold below, their claims are unpatentable on grounds which do not           
          involve Woo.                                                                
               The Examiner states that Woo claims the rejected invention             
          and, thus, the declaration is inappropriate (EA19).                         
               Appellants argue that Woo does not claim the same invention            
          because the presently claimed invention only requires the first             
          five steps of Woo's claim 1 (Br10).                                         
               Appellants erroneously interpret "the same patentable                  
          invention" as requiring identical claims, apparently in the sense           
          of the "same invention" for same invention-type double patenting            
          under 35 U.S.C. § 101, when the actual legal test of 37 CFR                 
          § 1.601(n) is anticipation or obviousness.                                  
               No patentability analysis is provided by the Examiner.                 
          Nevertheless, Appellants admit that Woo anticipates claim 21                
          because it is said that Woo claims the five steps of claim 21 in            
          addition to other steps (Br10).  Woo recites that the etch stop             
          layer prevents resputtering of the conductor during etching of              
          the second dielectric layer, but does not recite etching the etch           
          stop layer without resputtering, i.e., "without forming                     
          non-conductive back-sputtered compounds on sidewalls of the via."           
          Nevertheless, one of ordinary skill in the art would have                   
          appreciated that etching of the etch stop layer should not cause            
          back-sputtering or the purpose of using the etch stop layer would           
          be negated.  Appellants do not argue that the silicon nitride               

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