Ex Parte MCCARTHY - Page 2




          Appeal No. 2003-1195                                                        
          Application No. 08/526,339                                                  


               Representative independent claim 1 is reproduced as follows:           
               1.  A silicon on insulator self-aligned transistor,                    
          comprising:                                                                 
               a substrate composed of insulator material;                            
               a layer of doped polysilicon on a surface of said substrate,           
          said layer of polysilicon having sections defining therein a                
          polysilicon source, a polysilicon gate, and a polysilicon drain;            
               a layer of oxide material adjacent and in contact with a               
          surface of said layer of polysilicon, said layer of oxide                   
          material having holes therein containing doped polysilicon in               
          contact with said polysilicon source and said polysilicon drain;            
               a layer of silicon of conductivity type 1 adjacent and in              
          contact with a surface of said layer of oxide material;                     
               a diffused source and a diffused drain located in said layer           
          of conductivity type 1 silicon and in contact with said                     
          polysilicon source and said polysilicon drain via said doped                
          polysilicon contained in said holes in said layer of oxide                  
          material; and                                                               
               a pair of bridge regions located in said layer of                      
          conductivity type 1 silicon and in electrical contact with said             
          diffused source and said diffused drain guaranteeing electrical             
          contact with an inversion region located under said layer of                
          oxide material covered by said polysilicon gate.                            
               The examiner relies on the following references:                       
          Zavracky et al. (Zavracky)        5,206,749         Apr. 27, 1993           
          Spangler et al. (Spangler)        5,343,064         Aug. 30, 1994           
          Inoue et al. (Inoue)              5,434,441         Jul. 18, 1995           
               Claims 1-10 and 25-35 stand rejected under 35 U.S.C. § 112,            
          second paragraph.                                                           




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