Appeal No. 2005-0001 Application No. 09/268,902 response to a prompt we address infra with respect to Huddleston. We add that appellant’s specification, on page 14, line 22, equates power zones to areas of the core, which draw more or less current. We find that Mitsuhashi teaches setting a theoretical lattice over the circuit and breaks the circuit into sectional regions (item 11). (See, column 3, lines 35-39 and column 7, lines 58-61). The amount of current flowing in each of the sectional regions is calculated and the current in the power-source lines is analyzed. (See column 14, lines 11-21). The information is used to generate a display of current used in the sectional regions of the integrated circuit. (See column 10, lines 61-65). Thus, we find that the sectional regions refer to sections of the integrated circuit that consume power, which meets the claim limitation of “power zones.” Appellant further argues, on pages 10 and 11 of the brief that: [e]ven assuming, arguendo, one skilled in the art would consider the sectional regions 11 of Mitsuhashi to be similar to the presently claimed at least one power zone, the Office Action fails to present any objective evidence or convincing line of reasoning why one of skill in the art would consider determining the power consumption and a current amount in each of the sectional regions from the position of each element in a layout database for the design to be the same as accepting information for at least one power zone in the integrated circuit core, as presently claimed. Specifically, determining the power consumption and a current amount in each of the sectional regions from the position of each element in a layout database for the design involves post-layout simulation since the layout database must already exist. However, discovering voltage drop and electromigration problems after post-layout simulation can add days, if not weeks, to the design cycle time and can significantly decrease a product’s competitive advantage. In contrast, accepting design information of an integrated circuit core entered in response to a prompt and accepting information for at least one power zone in the integrated circuit core, as presently claimed, allow a designer to quickly and easily analyze power- -7-Page: Previous 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 NextLast modified: November 3, 2007