Ex Parte SCHULTZ - Page 15



                     Appeal No. 2005-0001                                                                                                      
                     Application No. 09/268,902                                                                                                


                     column 17, lines 3-11).   We find that Mitsuhashi teaches that the current density                                        
                     of each wire segment is calculated and compared to a maximum current density                                              
                     as part of an evaluation to determine whether there will be electromigration                                              
                     problems in the wiring (see Mitsuhashi column 16, lines 9-20).  Thus, regardless                                          
                     of whether the examiner’s rejection provides proper motivation to combine                                                 
                     Mitsuhashi and Huddleston, and Tuan or not , we will sustain the examiner’s                                               
                     rejection, as appellant’s arguments do not shown a limitation of representative                                           
                     claim 2 that Mitsuhashi does not teach.                                                                                   
                             Nonetheless, we find that the examiner’s rejection has provided the                                               
                     motivation to combine the references.  Tuan teaches a system for simulating a                                             
                     transistor network to calculate current flow (See Tuan, column 2, lines 9-14).                                            
                     Tuan teaches different methods of calculating current and that the segment                                                
                     average current method should be used for electromigration analysis as it                                                 
                     provides good accuracy and efficient simulation speed (See Tuan, column 6,                                                
                     lines 15-32).  We find that a skilled artisan would have been motivated to apply                                          
                     Tuan’s teaching of different methods of simulating current in integrated circuits to                                      
                     Mitsuhashi’s circuit analysis with the goal of gaining quick and accurate results.                                        
                     Thus, we find that the examiner has made a prima facie case of obviousness.                                               
                     Appellant’s arguments on pages 15 and 16 of the brief, challenging the                                                    
                     examiner’s rationale in support of the motivation to combine the references do                                            
                     not present any facts upon which to rebut the examiner’s prima facie case of                                              



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