Ex Parte Hwang et al - Page 4



          Appeal No. 2005-0579                                                        
          Application No. 09/887,910                                                  

          which is essentially the same as the tool described in Goeckner"            
          (page 7 of Brief, last paragraph).  It is the examiner's position           
          that, based on the combined teachings of Goeckner and Aronowitz,            
          it would have been obvious for one of ordinary skill in the art             
          to modify the ion implantation process of Goeckner to employ                
          pulsed low voltage nitrogen plasma doping to form a transistor              
          gate on the dielectric layer.  The sole argument advanced by                
          appellants is that "[a]n inventor has submitted an affidavit                
          stating his reasons why one skilled in the art would not be                 
          inclined to use the tool in Goeckner to carry out the invention             
          as claimed" (id.).                                                          
               Jack Hwang, one of the present inventors, is the author of             
          the Affidavit relied upon by appellants.  The affiant refers to             
          the tool of Goeckner as "the Varian tool," and states that "[t]he           
          Varian tool is typically used to implant ions to form source and            
          drain regions of transistors" (paragraph 4 of Affidavit).  The              
          affiant further explains that appellants have modified the Varian           
          tool to provide one order of magnitude less power, and that                 
          "[t]he application is also different in that our tool is used for           
          implanting ions into a gate dielectric layer of a transistor"               
          (paragraph 5 of Affidavit).  Affiant adds that he has a                     
          background in ion implantation and was transferred to a group               

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