Ex Parte Lehman - Page 4



          Appeal No. 2005-2310                                                        
          Application 10/287,168                                                      

                                       OPINION                                        
               We affirm the aforementioned rejections,                               
               The appellant states that the claims stand or fall together            
          (brief, page 8; reply brief, page 4).  Although, in the                     
          rejections over Omae, additional references are applied to                  
          independent claims 14 and 18 and dependent claims 5-7, 11, 15-17            
          and 19, the appellant does not separately argue the patentability           
          of those claims.  Accordingly, we limit our discussion to one               
          independent claim, i.e., claim 1.  See In re Ochiai, 71 F.3d                
          1565, 1566 n.2, 37 USPQ2d 1127, 1129 n.2 (Fed. Cir. 1995); 37 CFR           
          § 1.192(c)(7)(1997).                                                        
                          Rejection of claim 1 over Leonard                           
               Leonard discloses a method for automatically visually                  
          inspecting articles such as electronic circuits by comparing a              
          first set of image data representing a known good article to a              
          second set of image data representing an article under inspection           
          (col. 1, lines 13-14; col. 5, lines 7-20).                                  
               The appellant argues that Leonard discloses a die to die               
          system, and that the appellant’s claimed invention is not a die             
          to die system (brief, page 10).1  The appellant does not point              

               1 The appellant states that a die to die system is one “in             
          which a die is compared to a purportedly identical die on the               
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