Appeal No. 2005-2310
Application 10/287,168
We therefore are not convinced of reversible error in the
rejection of claim 1 over Leonard. Accordingly, we affirm the
rejection of that claim and claim 2 that stands or falls
therewith.
Rejection of claim 1 over Badger
Badger discloses a method for inspecting a mask or printed
wafer for defects by comparing the mask or printed wafer to a
library of acceptable images (col. 1, lines 8-10; col. 6,
lines 20-49).
The appellant argues that Badger discloses a die to database
system, and that the appellant’s invention is not a die to
database system (brief, page 11; reply brief, page 8).2 Badger
can compare the mask or printed wafer images to design data
(col. 6, lines 21-22) but, as pointed out above, he also
discloses comparing the mask or printed wafer images to a library
of acceptable images.
2 The appellant states that a die to database system is one
“in which data pertaining to a given die is compared to
information in a database, which could be the one from which the
reticle was generated” (specification, page 2, lines 5-7).
6
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