Appeal No. 2006-1049
Application No. 09/667,826
correction circuit comprises a plurality of parallel connected circuit elements and
means for selectively electrically connecting said circuit elements into the readout
cell in response to the stored offset correction value corresponding to said readout
cell.
25. An infrared imaging system as set out in claim 10, wherein said means
for biasing comprises a fixed voltage source coupled to said microbolometers.
26. An infrared imaging system as set out in claim 25, wherein said means
for correcting comprises a plurality of substantially constant current sources
selectively coupled to said voltage source and in parallel with said microbolometer.
27. An infrared imaging system as set out in claim 26, wherein said means
for correcting further comprises a plurality of switches coupled in series with
respective constant current sources.
28. An infrared imaging system as set out in claim 27, wherein said offset
correction values comprise an on or off signal supplied to each of said switches.
29. An infrared focal plane array, comprising:
a plurality of detector elements configured in a two dimensional array; and
a readout circuit electrically coupled to said plurality of detector elements
and structurally integrated therewith, said readout circuit comprising:
means for biasing the detector elements so as to provide an analog
detection signal from each detector element corresponding to the infrared
radiation incident thereon; and
means for correcting the analog detection signal from each detector
element by a discrete offset correction and providing a corrected analog
detection signal, the discrete offset correction varying from detector element
to detector element.
30. A focal plane array as set out in claim 29, wherein said analog detection
signal is a voltage signal and the discrete offset correction comprises an offset
correction voltage added to, or subtracted from, the voltage signal.
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