Appeal No. 2006-1049
Application No. 09/667,826
25. An infrared imaging system as set out in claim 10, wherein said means
for biasing comprises a fixed voltage source coupled to said [microbolometers]
microbolometer detector elements.
26. An infrared imaging system as set out in claim 25, wherein said means
for correcting comprises a plurality of substantially constant current sources
selectively coupled to said voltage source and in parallel with said microbolometer
detector elements.
27. through 28. (NO CHANGE)
29. through 32. (CANCELLED)
33. An infrared focal plane array [as set out in claim 32], comprising:
a plurality of detector elements configured in a two dimensional array; and
a readout circuit electrically coupled to said plurality of detector elements
and structurally integrated therewith, said readout circuit comprising:
a sample and hold capacitor;
means for biasing the detector elements so as to provide an analog detection
signal from each detector element corresponding to the infrared radiation incident
thereon, wherein the analog detection signal is a voltage signal provided at a
sample node coupled to the sample and hold capacitor; and
means for correcting the analog detection signal from each detector element
by a discrete offset correction and providing a corrected analog detection signal,
wherein the discrete offset correction varies from detector element to detector
element and comprises an offset correction voltage added to, or subtracted from,
the analog detection signal, wherein said means for correcting subtracts or adds a
variable amount of charge from said sample and hold capacitor to provide a
corrected voltage signal at said sample node, and wherein said means for
correcting comprises a plurality of capacitors connected between said sample node
and a reference voltage and a corresponding plurality of switches coupled in series
with each respective capacitor and said reference voltage, wherein said plurality of
switches are selectively turned on or off to provide a desired amount of discrete
offset correction for each detector element.
34. through 36. (NO CHANGE)
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