Ex Parte Cannata et al - Page 50



           Appeal No. 2006-1049                                                                     
           Application No. 09/667,826                                                               

                 31. A focal plane array as set out in claim 30, wherein said readout circuit       
           includes a sample and hold capacitor and wherein the detection voltage signal is         
           provided at a sample node coupled to the sample and hold capacitor and wherein           
           said means for correcting subtracts or adds a variable amount of charge from said        
           sample and hold capacitor to provide a corrected voltage signal at said sample           
           node.                                                                                    
                 32. A focal plane array as set out in claim 31, wherein said means for             
           correcting comprises a plurality of capacitors connected between said sample node        
           and a reference voltage and a corresponding plurality of switches coupled in series      
           with each respective capacitor and said reference voltage.                               
                 33. A focal plane array as set out in claim 32, wherein said plurality of          
           switches are selectively turned on or off to provide a desired amount of discrete        
           offset correction for each detector element.                                             
                 34. An infrared focal plane array as set out in claim 33, wherein said readout     
           circuit further comprises means for controlling said means for correcting so as to       
           selectively open and close said plurality of switches in a time multiplexed manner       
           during readout of a plurality of separate detector elements.                             
                 35. An infrared focal plane array as set out in claim 33, wherein said             
           detector elements comprise microbolometer detector elements.                             
                 36. An infrared focal plane array as set out in claim 35, wherein said means       
           for said biasing comprises a constant current source coupled to said                     
           microbolometer elements and said sample and hold capacitor.                              
                 37. An infrared focal plane array as set out in claim 31, wherein said means       
           for correcting comprises a plurality of parallel connected constant current sources      
           connected between said sample node and reference voltage and a plurality of              
           switches corresponding to said plurality of constant current sources and                 
           respectively coupled in series therewith.                                                
                 38. An infrared focal plane array as set out in claim 31, wherein said readout     
           circuit further comprises a differential amplifier having first and second inputs, the   
           first input thereof coupled to said sample node and said second input thereof            
           coupled to a adjustable voltage source.                                                  

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