Ex Parte Cannata et al - Page 64



           Appeal No. 2006-1049                                                                     
           Application No. 09/667,826                                                               

           and structurally integrated therewith, said readout circuit comprising:                  
                 a sample and hold capacitor;                                                       
                 means for biasing the detector elements so as to provide an analog detection       
           signal from each detector element corresponding to the infrared radiation incident       
           thereon, wherein the analog detection signal is a voltage signal provided at a           
           sample node coupled to the sample and hold capacitor; and                                
                 means for correcting the analog detection signal from each detector element        
           by a discrete offset correction and providing a corrected analog detection signal,       
           wherein the discrete offset correction varies from detector element to detector          
           element and comprises an offset correction voltage added to, or subtracted from,         
           the analog detection signal, wherein said means for correcting subtracts or adds a       
           variable amount of charge from said sample and hold capacitor to provide a               
           corrected voltage signal at said sample node, and wherein said means for                 
           correcting comprises a plurality of capacitors connected between said sample node        
           and a reference voltage and a corresponding plurality of switches coupled in series      
           with each respective capacitor and said reference voltage, wherein said plurality of     
           switches are selectively turned on or off to provide a desired amount of discrete        
           offset correction for each detector element.                                             
                 28. An infrared focal plane array as set out in claim 27, wherein said readout     
           circuit further comprises means for controlling said means for correcting so as to       
           selectively open and close said plurality of switches in a time multiplexed manner       
           during readout of a plurality of separate detector elements.                             
                 29. An infrared focal plane array as set out in claim 27, wherein said             
           detector elements comprise microbolometer detector elements.                             
                 30. An infrared focal plane array as set out in claim 29, wherein said means       
           for said biasing comprises a constant current source coupled to said                     
           microbolometer detector elements and said sample and hold capacitor.                     
                 31. An infrared focal plane array as set out in claim 27, wherein said readout     
           circuit further comprises a differential amplifier having first and second inputs, the   
           first input thereof coupled to said sample node and said second input thereof            
           coupled to a adjustable voltage source.                                                  
                 32. An infrared focal plane array as set out in claim 31, wherein said readout     
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