1. Fine trace limit 2. Broad trace limit The heat flux from the trace is spread (in x-direction) by the For broad traces on low conductivity boards, Region I is board and the board will do the bulk of the total heat transfer. dominating (note RI is independent of k) The classical heat sink fin formula [9] for a homogenously 1 1 Rtotv h w , (14) heated thin fin with (cf. Fig. 6) fin height B/2, fin length L 1 1 1 2v 1 2 1 2 'T v h 1w w t I h w t I , (15) and fin thickness D applied to Regions IIa and IIb is giving as thermal resistance Iv h1/2w 1t/2'1T 12/ . (16) 1 1 1 For high conductivity boards the width of the board B should R (8a) II 2 kmDL B replace w in Eq. (14) with the corresponding consequences of tanh(m ) 2 proportionalities in I and 'T. with To verify Eq. (10), disregarding form factors, we perform some more parameter variations, as shown in Fig. 8. Within a h m 2 . (8b) factor of Š2 the fine trace limit and the broad trace limit is kD fulfilled. The first factor 1/2 in Eq. (8a) is because the resistances of Regions IIa and IIb are parallel. 1. Broad trace limit For broad traces, which cover most of the board, Region I is dominating. The thermal resistance is given by the area of the footprint and the heat exchange coefficient according to Newton’s cooling law 1 R 1 I . (9) 2 hwL The factor 1/2 is because the resistances of the trace on top face and the thermal image of the footprint at the bottom face are parallel. 2. The total thermal resistance finally is (approximately) 1 1 1 . (10) Rtot R R I II Equations (8a,b), (9) and (10) are plotted as lines into Fig. 7 for the parameters given in the legend. The agreement is well regarding the crude mathematical modelling. The deviations between the points and the lines are of the order of Figure 8: Testing the scaling laws by parameter variations. Š2, reflecting uncertainties in defining fin cross-section and fin surface area for Eqs. (8a) and (8b): Assuming, that only 4.3. Thermal resistance of the traces on board models the top face of a bad heat spreading board will dominantly The board models of Sect. 4.1 are not as homogeneous as heat and cool, then RII would be about Š2 times larger. they are in Sect. 4.2 but have some thermal isolation between 4.2. Scaling laws trace and first heat spreading copper layer. Moreover, Joule Strict analytic solutions, although with necessary heating and external heat transfer is not independent of simplifications, of the 2D heat conduction equation in form of temperature or power. In order to test the findings of Section Fourier series are given by Ling [10]. However, the 4.1 we have re-plotted in Fig. 9 some graphs from Table 1, dependence of 'T(I) on h, k, D and w is hidden behind but with ordinate Rtrace='T/P as function of trace width. The complicated equations. Our simplified approach is a much power P is taken from Eqs. (3) and (4) with T as the mean easier route. trace temperature. 1. Fine trace limit In Fig. 9 there are two observations to be made. First, there is a bigger scatter in the data and, second, boards 2,4,6, For fine traces where Region II is dominating (note RII is which have the same amount of copper, are shifted in independent of w), the thermal resistance of the trace is ordinate. The scatter is certainly partially due to the non- 1/2 /21 1/2 Rtotv h k D . (11) constant heat transfer, e.g., at the left end of the abscissa at If we introduce Eq. (1) into 'T=Rtot*P together with Eq. (3) w=10 mm, the lower values of R correspond to the high and (4), the desired scaling laws are simply currents (high temperatures). In Appendix A we derive some ' T v 1/2 /21 1/2 1 1 I2 (12) approximate effective heat transfer coefficient heff as function h k D w t of power density q related through the expression heff=9 q0.14. or According to Eq. (11), the thermal resistance should scale /4 1/4 1/4 1/21/2 12/ I v h1 k D w t ' T . (13) with h-1/2, namely as q-0.07, namely as P-0.07. Adam, New Correlations Between Electrical Current and … 20th IEEE SEMI-THERM SymposiumPage: Previous 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 Next
Last modified: September 9, 2013