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Application/Control No. Applicant(s)/Patent Under
Reexamination
10/367,849
Notice of References Cited Examiner
Art Unit
2600 Page 1 of 1
Lun-Yi Lao
U.S. PATENT DOCUMENTS
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* MM-YYYY Name Classification
A US- -- --
B US-
C US-
D US-
E US-
F US-
G US-
H US-
I US-
J US-
K US-
L US-
M US-
FOREIGN PATENT DOCUMENTS
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* MM-YYYY Country Name Classification
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NON-PATENT DOCUMENTS
* Include as applicable: Author, Title Date, Publisher, Edition or Volume, Pertinent Pages)
* U Johannes Adam, New Correlations Between Electrical Current and Temperature Rise in PCB Traces, 20th IEEE SEMI-THERM
Symposium, 2004, available at http:www.flomerics.com/flotherm/technical_papers/t341.pds
* V Web-based document PCB Trace, HardwareBook (HwB), at www.hardwarebook.info/PCB_trace (providing data tables for
circuit board trace width)
W
X
*A copy of this reference is not being furnished with this Office action. (See MPEP § 707.05(a).)
Dates in MM-YYYY format are publication dates. Classifications may be US or foreign.
U.S. Patent and Trademark Office
PTO-892 (Rev. 01-2001) Notice of References Cited Part of Paper No.
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Last modified: September 9, 2013