Ex Parte M - Page 2



                  Appeal 2007-1312                                                                                          
                  Application 10/997,715                                                                                    

                         depositing a first uppercladding layer over the plurality of cores and                             
                  within the gaps with a high-density plasma process having a deposition-                                   
                  sputter ratio between 3:1 and 10:1 to partially fill the gaps, wherein the                                
                  deposition-sputter ratio is defined as the ratio of a sum of a net deposition                             
                  rate and a blanket sputtering rate to the blanket sputtering rate for the high-                           
                  density plasma process; and                                                                               
                         depositing a second uppercladding layer over the first uppercladding                               
                  layer with a PECVD process to completely fill the gaps.                                                   
                         20. The method recited in claim 1 wherein the first uppercladding                                  
                  layer has a refractive index between about 1.4443 and 1.4473 at a                                         
                  wavelength of 1550 nm.                                                                                    
                         29. The method recited in claim 1 wherein the first uppercladding                                  
                  layer fills the gaps to approximately 75% of a height of the cores and the                                
                  second uppercladding layer fills a remainder of the gaps.                                                 
                         The Examiner relies upon the following references as evidence of                                   
                  obviousness:                                                                                              
                  Schneider  US 4,557,561 Dec. 10, 1985                                                                     
                  Imoto  US 4,856,859 Aug. 15, 1989                                                                         
                  Dragone US 5,136,671 Aug.  4, 1992                                                                        
                  Liu  US 6,117,345 Sep. 12, 2000                                                                           
                  Narita  US 6,122,934 Sep. 26, 2000                                                                        
                  Bazylenko US 6,154,582 Nov. 28, 2000                                                                      
                  Rossman US 6,194,038 B1 Feb. 27, 2001                                                                     
                  Shieh  US 6,204,200 B1 Mar. 20, 2001                                                                      
                  Ngai  US 6,451,686 B1 Sep. 17, 2002                                                                       
                  Zhong US 6,705,124 B2 Mar. 16, 2004                                                                       
                  Official Notice, Office Action of Jan. 28, 2005 (bottom of page 6)                                        
                         Appellant’s claimed invention is directed to a method for forming an                               
                  optical waveguide on a substrate in a process chamber wherein a plurality of                              
                  separated optical cores are formed over an underclading layer that is                                     
                  deposited upon the substrate.  The optical cores define a sequence of gaps                                
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