Ex Parte Kamins et al - Page 8

               Appeal 2007-2983                                                                             
               Application 10/029,583                                                                       

                      Dependent claim 3 further requires that the nanoparticles used as a                   
               mask have an average particle size of around 1 to 10 nm.                                     
                      In addition to the arguments made against the Examiner’s rejection of                 
               independent claim 1, Appellants note that Hatakeyama is directed to the                      
               formation of nanoscale cones not the formation of pores.  Appellants                         
               maintain that the Examiner is selecting bits and pieces from unrelated prior                 
               art in asserting that the mask particle sizes of claim 3 would have been                     
               obvious to employ in Kikuchi’s process.                                                      
                      The difficulty we have with Appellants’ argument is that Kikuchi, as                  
               we explained above, provides the incentive for one of ordinary skill in the                  
               art to employ smaller mask particles to form smaller pores and ultimately                    
               smaller feature sizes.  Here, Appellants have not fairly established why one                 
               of ordinary skill of the art would not have found it obvious to employ                       
               smaller spheres or particles on the order of 10 nm in size for masking in the                
               process of Kikuchi in light of Kikuchi’s desire for small feature sizes, given               
               that such particles are readily available for use as an etching mask as shown                
               by Hatakeyama (Hatakeyama; col. 2, ll. 41-49).   In this regard, we note that                
               the Examiner is not relying on Hatakeyama for a teaching as to making a                      
               particular feature or for reactive ion etching but rather for the capability of              
               micro fabricating with nanoscale masking particles and etching (see, e.g.,                   
               Hatakeyama; col. 5, ll. 40-53).  Rejected claim 3, for example, is not limited               
               to a process for making a particular device after a pore is formed as                        
               evidenced by the open “comprising”  transitional term used in claim 1, from                  
               which claim 3 depends.   As such, much of the argumentation furnished by                     
               Appellants in the Brief appears to be misdirected.  On this record, we affirm                
               the Examiner’s obviousness rejection of claims 3, 21, and 22.                                

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