Ex parte SATO et al. - Page 18




          Appeal No. 95-1009                                                          
          Application 07/858,632                                                      



                    2.  A method according to claim 1, wherein said                   
          leveling is achieved by an additional deposition of the                     
          filling material.                                                           

                    3.  A method according to claim 1, wherein said                   
          leveling is achieved by a full surface etch back process.                   

                    4.  A method of fabricating an electronic device, of              
          the type wherein grooves formed in a substrate are filled up                
          with a filling material deposited by a deposition process in                
          which etching and deposition are achieved concurrently,                     
          wherein the improvement comprises:                                          
                         effecting said deposition process under such                 
          conditions that the difference in thickness of the deposited                
          filling material between a central portion and a peripheral                 
          portion of the substrate is canceled out; and                               
                         thereafter, polishing the substrate to smooth                
          the same.                                                                   

                    5.  A method of fabricating an electronic device, of              
          the type wherein grooves formed in a substrate are filled up                
          with a filling material deposited by a deposition process in                
          which etching and deposition are achieved concurrently,                     
          wherein the improvement comprises:                                          
                         after said deposition process, effecting an                  
          additional deposition process under such conditions that the                
          ratio of deposition rate to etching rate is greater at a                    
          peripheral portion than at a central portion of the substrate,              
          thereby reshaping the filling material deposited on the                     
          substrate by the first deposition process; and                              
                         thereafter, polishing the substrate to smoothen              
          the same.                                                                   

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