Ex parte TSUKAMOTO - Page 2




                Appeal No. 96-1549                                                                                                            
                Application 08/296,988                                                                                                        


                under 35 U.S.C. § 103 for obviousness over the prior art.   We                                 2                              
                reverse.                                                                                                                      
                         The invention is a semiconductor memory device which                                                                 
                includes a continuous buried layer which serves as a barrier                                                                  
                against "-ray induced carriers.                                                                                               
                         Claim 10, the sole appealed claim, reads as follows:                                                                 
                         10.  A semiconductor memory device including a memory sell                                                           
                having a write/read transistor and a charge storage capacitor                                                                 
                comprising:                                                                                                                   
                         a semiconductor substrate formed of a material having a                                                              
                first conductivity type and first impurity concentration, said                                                                
                substrate having a main surface;                                                                                              
                         a field oxide isolation film formed on said main surface for                                                         
                isolating semiconductor elements from each other;                                                                             
                         a pair of regions of a second conductivity type of said                                                              
                write/read transistor formed on said main surface, a first region                                                             
                of said pair of regions being connected with a bit line and the                                                               
                second region of said pair of regions being connected with one                                                                
                electrode of said charge storage capacitor;                                                                                   
                         a gate formed on said main surface between said pair of                                                              
                regions of said write/read transistor; and                                                                                    
                         a continuous buried layer of the first conductivity type                                                             
                formed to stop " particles having a second impurity concentration                                                             
                higher than said first impurity concentration of said substrate                                                               
                and being continuously formed in said substrate beneath said gate                                                             
                and said pair of regions of said write/read transistor as well as                                                             
                beneath said field oxide isolation film,                                                                                      


                         2This is the second § 134 appeal in this application.  In                                                            
                the first appeal (Appeal No. 93-3432), the Board affirmed the                                                                 
                § 103 rejection of a different claim, i.e., claim 9.                                                                          
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