Ex parte HUBER et al. - Page 9




          Appeal No. 97-0598                                                          
          Application 08/322,670                                                      


          opportunity to amend the claims around them would be unfair.                
          Therefore, we                                                               




          consider the rejection as it was presented in the final                     
          rejection, i.e., without the benefit of any newly offered                   
          evidence.                                                                   
               We have studied the arguments offered by the Examiner in               
          support of the enablement rejection and conclude that the                   
          Examiner has not met the burden of establishing a prima facie               
          case.  Appellants have disclosed, figure 4 and pages 4 to 6,                
          the process of manufacture of the claimed charge transfer                   
          plate having the spacing and the pin diameter of as low as 20               
          nanometers, resulting in a density of 10 billion pins per                   
          square centimeter of plate area.  Incidently, we note here                  
          that a U. S. Patent, 5,421,396, has been granted on the                     
          process itself covered by the parent application of this                    
          application.  The process disclosed is presumed to be valid                 
          unless there is factual evidence which puts its validity in                 
          question.  Here, the Examiner has not offered any objective                 
          and factual evidence to test the validity of the process of                 
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