Ex parte SHIROTA et al. - Page 2




          Appeal No. 1997-3442                                       Page 2           
          Application No. 08/210,288                                                  


               The invention pertains to a non-volatile semiconductor                 
          memory device, best described by reference to Figure 7A and to              
          independent claim 1 reproduced as follows:                                  
               1.   A nonvolatile semiconductor memory device comprising:             
               a plurality of NAND memory cells each having first and                 
          second terminals and constituted by connecting a plurality of               
          memory cells each having a control gate in series with each                 
          other, said NAND memory cells including adjacent first and                  
          second NAND memory cells;                                                   
               bit lines commonly used for NAND memory sets each                      
          constituted by at least said first and second NAND memory cells             
          of said NAND memory cells, said bit lines being coupled to the              
          first terminals of said NAND memory cells;                                  
               source lines commonly used for the NAND memory set each                
          constituted by at least said first and second NAND memory cells             
          of said NAND memory cells, said source lines being coupled to               
          the second terminals of said NAND memory cells;                             
               first selection transistors arranged between the first                 
          terminal of the first NAND memory cell and said bit line;                   
               second selection transistors arranged between the first                
          terminal of said second NAND memory cell and said bit line;                 
               third selection transistors arranged between the second                
          terminal of the first NAND memory cell and said source line;                
               fourth selection transistors arranged between the second               
          terminal of said second NAND memory cell and said source line;              
               a first control gate line coupled to at least control                  
          gates of said first selection transistors;                                  
               a second control gate line coupled to at least control                 
          gates of said second selection transistors;                                 







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