Ex parte ANJUM et al. - Page 5




          Appeal No. 1998-2925                                                        
          Application 08/532,861                                                      


          disclose whether the In functioned effectively when it was                  
          investigated.                                                               
               The examiner argues that it would have been obvious to                 
          one of ordinary skill in the art to substitute Lin’s In or                  
          dual In/B or In/BF  for the boron of Yoshizumi or Mitsui                    
                            2                                                         
          because of the benefits disclosed by Lin such as low leakage                
          current densities, good ideality factors, shallow junctions                 
          and low sheet resistances (answer, pages 5-8).  These                       
          benefits, however, are disclosed as being obtained by use of                
          dual implants, not single element implants (abstract).                      
               The examiner argues that Lin teaches that a single                     
          implant is effective (answer, page 9).  The single implant                  
          element, however, is Ga, not In (page 1791 and page 1792,                   
          table I).  The examiner argues that data for Ga and In are                  
          comparable (answer, page 10).  Even though appellants                       
          challenge this argument (reply brief, page 3), the examiner                 
          provides no supporting evidence.  The examiner’s mere                       
          speculation is not sufficient for establishing a prima facie                
          case of obviousness.  See In re Warner, 379 F.2d 1011, 1017,                
          154 USPQ 173, 178 (CCPA 1967), cert. denied, 389 U.S. 1057                  


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