Appeal No. 1999-1796
Application 08/705,149
refresh test mode controller coupled to the interface for
outputting internal test control signals in response to the
self refresh test control signals during a self refresh test
mode of the semiconductor device; self refresh circuitry
coupled to the self refresh test mode controller for producing
refresh signals . . . in response to the internal test control
signals during the self refresh test mode . . ." (emphasis
added). Thus, claim 1 requires more than just monitoring the
refresh operation as taught by Kang. Kang does not disclose
that the refresh address test circuit 30 produces internal
test control signals that are used to produce internal refresh
signals. Thus, the rejection of claim 1, and its dependent
claims 2-5 and 9-29, is reversed.
Claims 31-33
Claim 31 recites "an interface allowing connection with
an external device; . . . a self refresh test mode controller
. . . for receiving control signals from the interface and, in
response thereto, modifying performance of the semiconductor
device while it's in the self refresh test mode" (emphasis
added). Thus, claim 31 requires more than just monitoring the
refresh operation as taught by Kang. The refresh address test
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