Appeal No. 1999-1796
Application 08/705,149
testing device for controlling a self refresh test mode within
the semiconductor device; producing refresh signals . . . in
response to the self refresh test control signals . . ."
(emphasis added). Thus, claim 44 requires more than just
monitoring the refresh operation as taught by Kang. The
refresh address test circuit 30 in Kang does not produce
refresh signals. The rejection of claim 44, and its dependent
claims 45 and 46, is reversed.
Claim 47
Claim 47 recites "a self refresh test mode controller
. . . for controlling operation of at least one of the timer,
the buffer, and the decoder in outputting the self refresh
timing signals, holding the row addresses, and refreshing
selected rows in the array in response to self refresh test
mode control signals received from an external testing device"
(emphasis added). Kang does not disclose controlling internal
self refresh operations in response to test mode control
signals from an external testing device, much less the
specific operations claimed. The rejection of claim 47 is
reversed.
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